Question 5 of 7: Reading the Diffusivity Chart; Phosphorus Diffusion Flux in Silicon
Nivaar worked solution (AI-drafted; not reviewed by a licensed engineer)
Notes on this paper
National Exam 04-BS-11, Properties of Materials — May 2015. 3 hours,
closed-book examination (approved Casio or Sharp calculator only). Any five questions constitute
a complete paper; only the first five questions as they appear in the answer book are marked. All
seven questions are solved below for completeness.
Fig. Q5a — reproduction of Fig 1: diffusivity
(log scale) vs. $1/T$ for eight non-metallic diffusion systems; the Si-in-Si and Ge-in-Ge lines
(highlighted here in red/green) are the pair compared in part (v).
Given. (a) The plotted $\log_{10}D$ vs. $1/T\times1000$ chart above.
(b) 1 mm-thick Si wafer; initial P concentration $=1$ atom per $10^7$ Si atoms, to be raised
by a factor of 500; $D_P=10.5\times10^{-10}$ m$^2$/s; Si is diamond cubic, 8 atoms/cell,
$a_0=5.431$ Å.
Find. (a)(i)–(v) as stated. (b) Diffusion flux, expressed as P atoms
passing through one unit cell of Si per minute.
Approach
Part (a) is entirely chart interpretation using the Arrhenius form of the diffusion
coefficient, $D=D_0\exp(-Q_d/RT)$; part (b) is a steady-state Fick's-first-law flux calculation
where the given "atoms per $10^7$/atoms per unit cell" concentrations must first be converted to a
true volumetric concentration (atoms/m$^3$) before Fick's law can be applied, and the resulting
SI flux then converted into the specific unit cell/minute units the question asks for.
(a)(i) Units of diffusivity. Fick's first law is $J=-D\,dC/dx$, where $J$ is
a flux (amount per unit area per unit time, e.g. atoms/(m$^2$·s)) and $dC/dx$ is a
concentration gradient (amount per unit volume per unit length, e.g. atoms/m$^4$). Solving for $D$,
$$D=\frac{J}{dC/dx}=\frac{\text{atoms}/(\text{m}^2\cdot\text{s})}{\text{atoms}/\text{m}^4}
=\boxed{\text{m}^2/\text{s}}.$$
(a)(ii) Straight lines with negative slope. Diffusivity follows the Arrhenius
form $D=D_0e^{-Q_d/RT}$, so
$$\ln D=\ln D_0-\frac{Q_d}{R}\cdot\frac{1}{T}.$$
Plotting $\ln D$ (equivalently $\log_{10}D$) against $1/T$ therefore gives a straight line
with slope $-Q_d/R$ — negative because the activation energy $Q_d$ is always positive, i.e.
diffusion is a thermally-activated process that slows (D falls) as $T$ falls ($1/T$ rises). The
slope's magnitude is a direct, reproducible measure of the diffusing species' activation energy in
that host lattice.
(a)(iii) Why D(O in MgO) < D(Mg in MgO) at a given T. Both species migrate
via a cation/anion vacancy mechanism on their own sublattice, but the O$^{2-}$ anion
($r\approx1.40$ Å) is substantially larger than the Mg$^{2+}$ cation ($r\approx0.72$
Å). Moving the larger ion through the lattice requires more local lattice distortion to open
a large-enough passage, which raises the migration activation energy — hence a lower $D$ at
any given $T$ (visible on the chart as the O-in-MgO line sitting well below and to the right of
Mg-in-MgO).
(a)(iv) Why D(Mg in MgO) is close to, but higher than, D(Ni in MgO). Ni$^{2+}$
substitutes for Mg$^{2+}$ on the same cation sublattice, with a similar ionic radius
($r_{\text{Ni}^{2+}}\approx0.69$ Å vs. $r_{\text{Mg}^{2+}}\approx0.72$
Å) and identical $+2$ charge, so both diffuse by the same cation-vacancy mechanism with
similar activation energies — explaining why the two lines sit close together and roughly
parallel. Mg is nonetheless a self-diffusing species in its own host lattice, with no
size-mismatch strain energy to overcome, while Ni is a substitutional foreign ion that introduces
a small local strain/binding penalty; this slightly raises Ni's effective activation energy,
making Ni in MgO diffuse a little more slowly than Mg in MgO at the same temperature.
(a)(v) Comparing Si-in-Si and Ge-in-Ge. Reading two points off each line
(approximate, to chart precision):
System
Point 1 ($1/T\times1000$, $\log_{10}D$)
Point 2
Chart-read $Q_d$
Si in Si
(0.603, −15.04)
(0.741, −18.61)
≈495 kJ/mol
Ge in Ge
(0.851, −15.63)
(1.017, −18.09)
≈284 kJ/mol
Interpreting the comparison. Both self-diffusion lines have a similar visual
character (straight, negative slope), but Ge's line sits well to the right of Si's and
its chart-read activation energy ($\approx$284 kJ/mol) is much lower than Si's ($\approx$495
kJ/mol) — in good agreement with literature values ($Q_d(\text{Si})\approx460$–500,
$Q_d(\text{Ge})\approx290$–330 kJ/mol), which is a useful check on the chart reading.
Check
Chart-read activation energies carry the
plotted line's own reading precision (± a fraction of a decade); they are reported here to
3 significant figures for traceability, not as exact literature values.
Significance: Ge's weaker, longer covalent bonds (larger atomic radius, lower
melting point 938°C vs. Si's 1414°C) make vacancy formation and migration easier, so Ge
reaches a technologically useful diffusivity at a much lower processing temperature than Si does.
This is exactly why early Ge-based devices could be processed at lower temperatures, while modern
Si technology — which relies on Si's higher $Q_d$ for tighter, more thermally stable
dopant-diffusion control — requires substantially higher processing temperatures for
comparable diffusion depths.
(b) Convert given concentrations to atoms/m$^3$. Si is diamond cubic with 8
atoms/unit cell and $a_0=5.431\times10^{-10}$ m, so the Si atomic number density is
$$n_{\text{Si}}=\frac{8}{a_0^3}=\frac{8}{(5.431\times10^{-10})^3}=5.00\times10^{28}\ \text{Si atoms/m}^3.$$
The initial P concentration (1 per $10^7$ Si atoms) is $C_1=n_{\text{Si}}/10^7$; raising it by
a factor of 500 gives $C_2=500\,C_1$, so
$$\Delta C=C_2-C_1=499\,C_1=499\times\frac{n_{\text{Si}}}{10^7}=2.495\times10^{24}\ \text{P atoms/m}^3.$$
Steady-state flux across the wafer. Treating the 1 mm wafer thickness as the
diffusion distance in a steady-state, linear concentration profile,
$$J=D_P\frac{\Delta C}{L}=10.5\times10^{-10}\times\frac{2.495\times10^{24}}{1.0\times10^{-3}}
=\boxed{2.62\times10^{18}\ \text{atoms/(m}^2\cdot\text{s)}}.$$
Convert to atoms per unit cell per minute. The requested answer is not the
raw SI flux but the number of P atoms crossing one unit-cell cross-section per
minute — two separate unit conversions beyond $J$ itself: multiply by the unit
cell's cross-sectional area $a_0^2$ (atoms/s through one cell), then by 60 (atoms/min):
$$a_0^2=(5.431\times10^{-10})^2=2.949\times10^{-19}\ \text{m}^2,$$
$$\text{rate}=J\times a_0^2\times60=2.62\times10^{18}\times2.949\times10^{-19}\times60
=\boxed{46.3\ \text{P atoms per unit cell per minute}}.$$