23-Ind-A5 Quality Planning, Control, and Assurance · May 2013
Nivaar worked solution (AI-drafted; not reviewed by a licensed engineer)
National Exams — May 2013 — 98-Ind-A5 Quality Planning, Control and Assurance. Three-hour, closed-book exam; Casio or Sharp approved calculators only; one double-sided 8.5×11 aid sheet permitted; relevant statistical tables attached. Format: six questions, each worth 20 marks; any five constitute a complete paper, and only the first five appearing in the answer book are marked, so candidates effectively choose 5 of 6. All six are solved below for completeness.
Reference texts: Montgomery, Introduction to Statistical Quality Control (8th ed.) — control charts, process capability, acceptance sampling and design of experiments for quality improvement (the primary text for every part of this paper); Hillier & Lieberman, Introduction to Operations Research (11th ed.) — probability/decision background; ISO 9001:2015 — quality management systems and certification; MIL-STD-105E — sampling procedures and tables for inspection by attributes.
Question text not reproduced: the examination questions are © Engineers and Geoscientists BC. Open the official past paper (linked at the top of this page) to read the question, then follow the worked solution below.
The p-chart plots the fraction nonconforming ($\hat p=x/n$) in each sample and, because it is a proportion, naturally accommodates a varying sample size $n$ from period to period (its control limits, $\bar p\pm3\sqrt{\bar p(1-\bar p)/n}$, simply widen or narrow with $n$). The np-chart plots the raw count of nonconforming units and requires a constant sample size, because a count is only comparable across samples if the opportunity to accumulate that count (the sample size) does not change; it is otherwise the same underlying binomial model as the p-chart and is often preferred on the shop floor because operators find a raw count more intuitive than a fraction.
The c-chart plots the count of nonconformities (not nonconforming units — a single unit can have several nonconformities) found in a constant inspection unit, modelled as Poisson with limits $\bar c\pm3\sqrt{\bar c}$. The u-chart plots nonconformities per inspection unit, $u=c/n$, and like the p-chart accommodates a varying number of inspection units per sample, with limits $\bar u\pm3\sqrt{\bar u/n}$. Both are used when a product can exhibit multiple, independent defects of the same general type (solder joints, cosmetic blemishes, workmanship nonconformities) rather than being simply good or bad.
A demerit chart extends the c/u-chart idea to account for the fact that not all nonconformities are equally serious: each defect is classified into a severity class (e.g., very serious, serious, moderate, minor) and assigned a demerit weight (a common convention is 100/50/10/1), and the chart plots a single weighted demerit score per unit rather than a plain count. This is more informative than a c- or u-chart whenever defect severity varies materially, because it prevents a large number of trivial cosmetic nonconformities from masking, or a single critical nonconformity from being under-weighted relative to, the count-only picture.
Given. Ten days of inspection; inspection unit $=$ 1 assembly; sample size (assemblies inspected) and total nonconformities found vary by day:
| Day | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 |
|---|---|---|---|---|---|---|---|---|---|---|
| Assemblies inspected, $n_i$ | 2 | 4 | 2 | 1 | 3 | 4 | 2 | 4 | 3 | 1 |
| Nonconformities, $c_i$ | 0 | 10 | 8 | 5 | 5 | 5 | 4 | 6 | 6 | 3 |
Find. $u$-chart control limits (varying, since $n_i$ varies), whether the process is in control, and the in-control estimate of nonconformities per assembly, $\hat\lambda=\bar u$.
Approach. Pool all ten days to estimate the process average nonconformity rate $\bar u=\sum c_i/\sum n_i$, then compute a separate control limit pair for each day from its own $n_i$ (the varying-sample-size u-chart), and check every plotted $u_i=c_i/n_i$ against its own day-specific limits.
| Quantity | Result |
|---|---|
| Centre line $\bar u$ | 2.00 nonconformities/assembly |
| $UCL_i$ range ($n_i=1$ to $4$) | 4.12 to 6.24 (all $LCL_i=0$) |
| Process in control? | Yes — all 10 points inside their own limits, no revision needed |
| $\hat\lambda$ (in-control rate, used in part c) | 2.00 nonconformities/assembly |
Given. $\hat\lambda=2.00$ nonconformities/assembly from part (b); the new inspection unit is redefined as 2 assemblies; the shift of interest is from $\lambda$ to $1.5\lambda$ per assembly; target: detect on the 1st or 2nd sample after the shift with probability $\geq0.7$.
Find. The minimum constant number of (2-assembly) inspection units per sample, $k$, that meets the target.
Approach. Re-express the in-control and shifted rates on the new (2-assembly) inspection unit, fix the control limit at the pre-shift rate (the chart doesn't know a shift has happened), then find the smallest sample size $k$ (number of new inspection units per sample) for which the single-sample detection probability $p_1$ satisfies $1-(1-p_1)^2\geq0.7$, i.e. $p_1\geq1-\sqrt{0.3}=0.4523$.
| $k$ | 6 | 7 | 8 | 9 | 10 |
|---|---|---|---|---|---|
| $UCL(k)$ | 6.449 | 6.268 | 6.061 | 6.000 | 5.897 |
| $p_1(k)$ | 0.327 | 0.386 | 0.444 | 0.500 | 0.553 |
| $1-(1-p_1)^2$ | 0.547 | 0.623 | 0.691 | 0.750 | 0.800 |
| Quantity | Result |
|---|---|
| $m_0$ (pre-shift, per new unit) | 4.00 |
| $m_1$ (post-shift, per new unit) | 6.00 |
| Required $p_1$ | $\geq0.4523$ |
| Minimum $k$ (2-assembly inspection units) | 9 |
| Minimum sample size in assemblies | 18 |