22-Elec-B10 Electro-Optical Engineering · May 2015
Question 4 of 6: Silicon Photodiode — Responsivity, Bandwidth and Noise
Nivaar worked solution (AI-drafted; not reviewed by a licensed engineer)
Notes on this paper
Paper format. National Exams, May 2015 — 07-Elec-B10
Electro-Optical Engineering. Three hours, closed book; one 8.5 in ×
11 in double-sided sheet of hand-written notes and one approved Casio or
Sharp calculator are permitted. Six questions are printed; any five constitute a
complete paper and all questions are of equal value (20 marks each).
All six are solved here, because the set is a study resource
rather than a timed sitting. The constants used throughout are those printed on
page 1 of the paper:
$\varepsilon_0 = 8.854\times10^{-12}$ F/m,
$\mu_0 = 4\pi\times10^{-7}$ H/m,
$c = 2.998\times10^{8}$ m/s,
$q = 1.602\times10^{-19}$ C,
$h = 6.626\times10^{-34}$ J·s,
$k = 1.381\times10^{-23}$ J/K, and the semiconductor data
(GaAs: $n = 3.63$, $E_g = 1.41$ eV; Si: $E_g = 1.11$ eV;
InGaAsP: $n = 3.5$).
Reference texts. The Engineers Canada syllabus for this
examination code draws on the standard fibre-optic and photonics texts, and the
solutions below cite them by chapter:
G. Keiser, Optical Fiber Communications, 5th ed., McGraw-Hill
— the primary reference for fibre dispersion, sources, detectors,
receivers and link budgets.
B. E. A. Saleh and M. C. Teich, Fundamentals of Photonics, 3rd ed.,
Wiley — semiconductor sources, laser rate equations and photodetector
noise.
J. Wilson and J. F. B. Hawkes, Optoelectronics: An Introduction,
3rd ed., Prentice Hall — device-level treatment of LEDs, laser diodes and
photodiodes.
J. M. Senior, Optical Fiber Communications: Principles and Practice,
3rd ed., Pearson — rise-time budgets and receiver front-end comparison.
Given. A silicon PIN photodiode whose measured responsivity
curve is reproduced below, operated with the electrical parameters collected
here.
Given data
Quantity
Symbol
Value
Photosensitive area
$A$
5 mm$^2$
Reverse bias
$V_R$
30 V
Dark current
$I_d$
10 nA
Junction capacitance
$C_j$
3 pF
Amplifier input capacitance
$C_a$
7 pF
Carrier transit time
$\tau_{tr}$
0.5 ns
Load resistance
$R_L$
50 Ω
Temperature
$T$
300 K
Responsivity read at 850 nm
$R$
0.56 A/W (30 V), 0.54 A/W (0 V)
Find. An explanation of the responsivity curve; the quantum
efficiency at 850 nm with and without bias; the light intensity that matches
the dark current; the detection bandwidth and response time; the quantum- and
thermal-noise-limited SNR and the NEP at 10 µW; and the operating
mode with its load line.
[Figure not reproduced: Measured responsivity of the silicon photodiode, redrawn from the printed figure. At 850 nm the curve reads about 0.56 A/W with 30 V of reverse bias and about 0.54 A/W unbiased. See the official exam paper.]
Approach. Read the responsivity off the curve and convert it
to quantum efficiency through $R = \eta q\lambda/hc$; combine the $RC$ time
constant with the transit time to get the response time and hence the bandwidth;
then evaluate the shot- and thermal-noise-limited SNRs at that bandwidth.
Part (a) — reading the curve. Three features define
it. At long wavelengths the response collapses beyond about 1100 nm,
because a silicon photon must carry at least the indirect band gap to create a
pair; the cut-off is
$$\lambda_c = \frac{hc}{E_g} = \frac{1240\ \text{eV}\cdot\text{nm}}{1.11\ \text{eV}}
= 1117\ \text{nm},$$
matching the printed roll-off exactly. At short wavelengths the response also
falls, but for the opposite reason: the absorption coefficient of silicon is so
large in the blue and ultraviolet that carriers are generated within a few tens
of nanometres of the surface, inside the heavily doped contact layer, where they
recombine at surface states before they can be collected. Between those two
limits the responsivity rises almost linearly with wavelength, which is exactly
what $R = \eta q \lambda / hc$ predicts at constant quantum efficiency —
a longer-wavelength photon carries less energy, so a given optical power
delivers more photons and hence more current. The peak near 900 nm is where
the rising $\lambda$ factor meets the falling absorption. Finally, the 30 V
curve lies above the unbiased one over the long-wavelength half of the range,
because reverse bias widens the depletion layer and sweeps out carriers
generated deeper in the silicon, precisely where the weakly absorbed
near-infrared photons are stopped.
Part (b): quantum efficiency at 850 nm. Responsivity and
quantum efficiency are related by $R = \eta\,q\lambda/(hc)$, so
$$\eta = \frac{R\,hc}{q\lambda} = \frac{1240\ \text{eV}\cdot\text{nm}}
{850\ \text{nm}}\cdot\frac{R}{1\ \text{V}} = 1.459\,R .$$
Reading the curve at 850 nm gives
$$\eta(30\ \text{V}) = 1.459(0.56) = \boxed{\;0.82\ \ (82\ \%)\;},
\qquad
\eta(0\ \text{V}) = 1.459(0.54) = \boxed{\;0.79\ \ (79\ \%)\;}$$
The three-point gain from reverse bias is the deeper depletion region collecting
carriers that would otherwise recombine.
Part (c): the optical power that matches the dark current.
Setting $I_p = I_d = 10$ nA and inverting the responsivity,
$$P = \frac{I_d}{R} = \frac{10\times10^{-9}}{0.56}
= 1.786\times10^{-8}\ \text{W} = 17.9\ \text{nW}.$$
Spread over the 5 mm$^2$ window this is an irradiance of
$$E = \frac{P}{A} = \frac{1.786\times10^{-8}}{5\times10^{-6}\ \text{m}^{2}}
= \boxed{\;3.57\ \text{mW/m}^{2} = 0.357\ \mu\text{W/cm}^{2}\;}$$
This is the illumination at which the detector is exactly as noisy as it is
useful — a convenient practical definition of the point where dark current
starts to matter.
Part (d): the two time constants. The junction and
amplifier capacitances appear in parallel across the load, so
$$C_T = C_j + C_a = 3 + 7 = 10\ \text{pF},
\qquad \tau_{RC} = R_L C_T = (50)(10\times10^{-12}) = 0.50\ \text{ns}.$$
This happens to equal the quoted transit time, so neither mechanism can be
neglected.
Combine them and convert to bandwidth. Independent
broadening mechanisms add in quadrature:
$$\tau = \sqrt{\tau_{tr}^{2}+\tau_{RC}^{2}} = \sqrt{0.5^{2}+0.5^{2}}
= \boxed{\;0.71\ \text{ns}\;}$$
and the corresponding $-3$ dB electrical bandwidth of a single-pole
response is
$$B = \frac{1}{2\pi\tau} = \frac{1}{2\pi(0.707\times10^{-9})}
= \boxed{\;225\ \text{MHz}\;}$$
Quoted as a 10–90 % rise time this is $0.35/B = 1.56$ ns.
Reducing the load to, say, 10 Ω would make the detector
transit-time-limited at about 440 MHz — but at the cost of a
five-fold larger thermal noise current, which is the trade the next part
quantifies.
Part (e): photocurrent at 10 µW.
$$I_p = R\,P = (0.56)(10\times10^{-6}) = 5.6\ \mu\text{A}.$$
Quantum (shot) noise limit. If the detector were perfect
and only the discreteness of the photoelectrons limited it,
$$\mathrm{SNR}_q = \frac{I_p^{2}}{2q I_p B} = \frac{I_p}{2qB}
= \frac{5.6\times10^{-6}}{2(1.602\times10^{-19})(2.251\times10^{8})}
= \boxed{\;7.76\times10^{4} = 48.9\ \text{dB}\;}$$
Thermal noise limit. With the real 50 Ω load,
$$\langle i_T^{2}\rangle = \frac{4kTB}{R_L}
= \frac{4(1.381\times10^{-23})(300)(2.251\times10^{8})}{50}
= 7.46\times10^{-14}\ \text{A}^{2},$$
$$\mathrm{SNR}_T = \frac{I_p^{2}}{\langle i_T^{2}\rangle}
= \frac{(5.6\times10^{-6})^{2}}{7.46\times10^{-14}}
= \boxed{\;420 = 26.2\ \text{dB}\;}$$
The gap of nearly 23 dB between the two limits is the price of the
resistive front end: this detector is nowhere near the quantum limit, and a
transimpedance or high-impedance amplifier (Question 5) is the standard
remedy.
Noise-equivalent power. The NEP is the optical power that
would produce a signal equal to the noise in a 1 Hz band. With no signal
present the noise density is thermal plus dark-current shot noise,
$$i_n = \sqrt{\frac{4kT}{R_L}+2qI_d}
= \sqrt{3.314\times10^{-22}+3.20\times10^{-27}}
= 1.82\times10^{-11}\ \text{A}/\sqrt{\text{Hz}},$$
so
$$\mathrm{NEP} = \frac{i_n}{R} = \frac{1.82\times10^{-11}}{0.56}
= \boxed{\;3.25\times10^{-11}\ \text{W}/\sqrt{\text{Hz}}
\ \ (32.5\ \text{pW}/\sqrt{\text{Hz}})\;}$$
Over the full 225 MHz band that corresponds to
$\mathrm{NEP}\sqrt{B} = 0.49\ \mu\text{W}$ — consistent with the
26.2 dB found above for a 10 µW signal, since
$(10/0.49)^{2} = 417$.
Part (f) — operating mode and load line. The diode is
held at 30 V of reverse bias, so it is operating in the
photoconductive mode, not the photovoltaic mode. In the
photovoltaic mode the diode is unbiased or open-circuited and works in the
fourth quadrant near $I = 0$, delivering power like a solar cell: the response
is logarithmic in illumination, the depletion layer is narrow and the junction
capacitance large, so the device is slow but has no dark current and hence very
low noise. Reverse biasing moves the operating point deep into the fourth
quadrant along the near-vertical load line drawn below, where the reverse
current is essentially independent of voltage and therefore linear in
optical power — the property this whole question relies on. The wider
depletion layer also reduces $C_j$ and raises the field, giving the
0.5 ns transit time and the 225 MHz bandwidth of part (d), at the
cost of the 10 nA dark current. Because $R_L$ is only 50 Ω, the
load line is very nearly vertical: the largest photocurrent considered here,
5.6 µA, drops just 0.28 mV across the load, so the diode voltage
stays at $-30$ V for every practical illumination.
Current-voltage characteristic of the photodiode with the 50 ohm load line. Reverse bias places the operating point in the fourth quadrant, where the reverse current is set by the illumination and is almost independent of voltage.