23-Ind-A5 Quality Planning, Control, and Assurance · Undated paper
Nivaar worked solution (AI-drafted; not reviewed by a licensed engineer)
National Exams, May 2019. Closed-book examination. Any five of the six questions constitute a complete paper; all six are answered in full below. Relevant statistical tables (cumulative standard normal distribution, factors for constructing variables control charts, MIL-STD-105E Table I) are reproduced/applied from the paper's own attached appendices.
Reference texts: Montgomery, Introduction to Statistical Quality Control (8th ed.) — Ch. 1–2 (quality philosophy, cost of quality, Six Sigma/TQM, ISO 9000/TS16949), Ch. 4–6 (magnificent seven SPC tools, process capability, X̄-R and attributes control charts), Ch. 9 (average run length), Ch. 13–14 (designed experiments/factorial designs, acceptance sampling and MIL-STD-105E).
Question text not reproduced: the examination questions are © Engineers and Geoscientists BC. Open the official past paper (linked at the top of this page) to read the question, then follow the worked solution below.
In an acceptance-sampling/capability context, the producer's risk ($\alpha$) is the probability that a genuinely good lot or process (quality at or better than the Acceptable Quality Level) is nevertheless rejected by the sampling plan/decision rule — a Type I error from the producer's point of view, since a good lot is wrongly penalized. The supplier's (consumer's) risk ($\beta$) is the probability that a genuinely bad lot or process (quality at or worse than the Rejectable/Lot-Tolerance Quality Level) is nevertheless accepted — a Type II error, since the consumer wrongly receives poor-quality product. Both risks are read as two points on the same operating-characteristic (OC) curve of the sampling plan or decision rule: $\alpha=1-P_a(AQL)$ and $\beta=P_a(RQL)$, where $P_a(p)$ is the probability of acceptance as a function of true quality $p$.
Yes, the process should be in statistical control before a capability analysis is performed. A capability index is a statement about what the process will continue to produce, projected from the sample data; if the process is not in control its mean and/or variance are not stable, so $\bar x$ and $s$ do not estimate fixed, meaningful parameters and any index computed from them only describes the specific unstable sample taken — it is not predictive of future output.
$C_p=(USL-LSL)/6\sigma$ measures potential capability — how the process spread compares with the tolerance band, ignoring where the process is centred; it can be high even for a badly off-target process. $C_{pk}=\min[(USL-\mu)/3\sigma,\ (\mu-LSL)/3\sigma]$ measures actual capability using the distance from the mean to the nearer spec limit, so it penalizes an off-centre process; $C_{pk}\le C_p$ always, with equality iff the process is perfectly centred at $(USL+LSL)/2$.
Relation between $C_p$ and $C_{pm}$. $C_{pm}=(USL-LSL)/\big(6\sqrt{\sigma^2+(\mu-T)^2}\big)$ (the Taguchi capability index) replaces $\sigma$ in $C_p$'s denominator with the root-mean-square deviation from the target $T$ (not necessarily the spec midpoint), so $C_{pm}=C_p/\sqrt{1+\big[(\mu-T)/\sigma\big]^2}$ — $C_{pm}\le C_p$ always, with equality iff $\mu=T$, and $C_{pm}$ falls off faster than $C_{pk}$ as the process drifts because it penalizes distance from the target directly (a quadratic, Taguchi-loss-consistent penalty) rather than only the distance to the nearer tolerance boundary.
Non-normal capability. As in Q1(a), the standard indices assume normality and are unreliable for skewed/heavy-tailed data; the usual fixes are (1) fit a normalizing transformation (Box-Cox, Johnson) and compute $C_p/C_{pk}$ on the transformed scale; (2) fit the characteristic's actual distribution and define percentile-based indices that replace $\mu\pm3\sigma$ with the fitted distribution's own 0.135 and 99.865 percentiles, e.g. $C_p=(USL-LSL)/(x_{0.99865}-x_{0.00135})$; or (3) use a nonparametric/distribution-free tolerance interval from order statistics when no parametric family fits well.
Given. $C_p=1.33,\ C_{pk}=1.05$; normal distribution; two-sided spec (LSL, USL unspecified numerically — solved in units of $\sigma$); target $T=(USL+LSL)/2$.
Find. $P(X\lt LSL)+P(X\gt USL)$; $C_{pm}$; how the total fraction nonconforming changes if the process is re-centered at $T$.
Approach. Let $d=(USL-LSL)/2$ so $C_p=d/3\sigma$, and $C_{pk}$ uses the distance to the nearer limit: $C_p-C_{pk}=|\mu-T|/3\sigma$. This fixes both spec limits' distances from $\mu$ in units of $\sigma$ without needing the numeric LSL/USL.
| Quantity | Value |
|---|---|
| $Z_{\text{near}},\ Z_{\text{far}}$ | 3.15σ, 4.83σ |
| Total fraction nonconforming | 0.0817% |
| $C_{pm}$ | 1.018 |
| Fraction nonconforming if centered | 0.00661% ($\approx12\times$ better) |